CSAFM Nose Cone
Category: Electronics, Tips & Probe holders
In Stock (2 available)
Compatible Models:
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All products come with a 1-year manufacturer warranty.
Returns accepted within 30 days of purchase. Item must be in original condition.
Product Description
Precision Nose Cone for Simultaneous Electrical and Topographical Measurements
The CS-AFM Nose Cone is a specialized accessory designed for conductive atomic force microscopy (C-AFM) applications. It enables high-resolution electrical conductivity mapping while performing standard topographical scans—providing powerful insight into a sample’s surface and electrical properties in a single pass.
Engineered to overcome the limitations of standard imaging, this nose cone is essential for researchers working with semiconductors, thin films, polymers, and nanomaterials, where electrical characterization is critical.
✅ Simultaneous topography and current mapping
✅ Stable probe alignment for high-precision electrical measurements
✅ Durable, chemically resistant materials for a wide range of sample environments
Compatible with: Molecular Imaging, Agilent, and KeysightAFM systems
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