Your go-to resource for the latest news, insights, and innovations in Atomic Force Microscopy parts and accessories.
May 29, 2026
Compare AFM probe prices from leading suppliers to find the best deals on atomic force microscopy tips and probes.
May 27, 2026
AFM cantilevers are flexible microbeams that detect surface forces, serving as the critical sensing element in atomic force microscopy measurements.
May 25, 2026
Discover premium AFM cantilevers and probes designed for precise atomic force microscopy measurements and reliable research applications.
March 14, 2026
By AFM-Parts.com | Atomic Force Microscopy Resources Acquiring a new atomic force microscope is one of the most significant equipment decisions a university laboratory can make. AFMs represent a major capital investment, and the choice of platform has long-term implications — from the range of imaging modes available to software support, consumables cost, and the […]
February 23, 2026
AFM Parts Deep Dive The Agilent 5100 (PicoLE) SPM System: A Legacy Platform Still Powering World-Class Research How a cost-effective entry-level scanning probe microscope earned its place in peer-reviewed nanotechnology research—and why labs worldwide still depend on it today. In the world of scanning probe microscopy, newer doesn’t always mean better. The Agilent 5100 (PicoLE) […]